Friday, July 4, 2008

Crystal Impact Match v1.7-TDK



Match! is an easy-to-use software for phase identification from powder diffraction data, which has become a daily task in material scientists work. Match! compares the powder diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Single as well as multiple phases can be identified based on both peak data and raw (profile) data.

As reference database, we recommend to apply the ICDD PDF-2 or PDF-4 databases. Besides this, you can also create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak list files, or calculated from crystal structure data (e.g. given as CIF files). It is also possible to add your colleague's user database to your own so that the same data do not have to be entered more than once.


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